Machine Learning Systems in the IoT: Trustworthiness Trade-offs for Edge Intelligence

Wiebke Toussaint, Aaron Yi Ding. Machine Learning Systems in the IoT: Trustworthiness Trade-offs for Edge Intelligence. In 2nd IEEE International Conference on Cognitive Machine Intelligence, CogMI 2020, Atlanta, GA, USA, October 28-31, 2020. pages 177-184, IEEE, 2020. [doi]

@inproceedings{ToussaintD20,
  title = {Machine Learning Systems in the IoT: Trustworthiness Trade-offs for Edge Intelligence},
  author = {Wiebke Toussaint and Aaron Yi Ding},
  year = {2020},
  doi = {10.1109/CogMI50398.2020.00030},
  url = {https://doi.org/10.1109/CogMI50398.2020.00030},
  researchr = {https://researchr.org/publication/ToussaintD20},
  cites = {0},
  citedby = {0},
  pages = {177-184},
  booktitle = {2nd IEEE International Conference on Cognitive Machine Intelligence, CogMI 2020, Atlanta, GA, USA, October 28-31, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-4144-2},
}