Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions

Son-Ha Tran, L. Dupont, Zoubir Khatir. Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions. Microelectronics Reliability, 54(9-10):1921-1926, 2014. [doi]

Abstract

Abstract is missing.