Applications of Phasor Data Analysis on Scattering Scanning Near-field Optical Microscopy Investigations

Denis E. Tranca, Arcadie Sobetkii, Radu Hristu, Stefan G. Stanciu, Catalin Stoichita, George A. Stanciu. Applications of Phasor Data Analysis on Scattering Scanning Near-field Optical Microscopy Investigations. In 23rd International Conference on Transparent Optical Networks, ICTON 2023, Bucharest, Romania, July 2-6, 2023. pages 1-4, IEEE, 2023. [doi]

Abstract

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