Characterization of an LVDS Link in 28 nm CMOS for Multi-Purpose Pattern Recognition

Gianluca Traversi, Francesco De Canio, Valentino Liberali, Alberto Stabile. Characterization of an LVDS Link in 28 nm CMOS for Multi-Purpose Pattern Recognition. In IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy. pages 1-4, IEEE, 2018. [doi]

Abstract

Abstract is missing.