D. Trémouilles, S. Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken. Transient voltage overshoot in TLP testing - Real or artifact?. Microelectronics Reliability, 47(7):1016-1024, 2007. [doi]
@article{TremouillesTRNVG07,
title = {Transient voltage overshoot in TLP testing - Real or artifact?},
author = {D. Trémouilles and S. Thijs and Philippe Roussel and M. I. Natarajan and Vesselin K. Vassilev and Guido Groeseneken},
year = {2007},
doi = {10.1016/j.microrel.2006.11.004},
url = {http://dx.doi.org/10.1016/j.microrel.2006.11.004},
tags = {testing},
researchr = {https://researchr.org/publication/TremouillesTRNVG07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {7},
pages = {1016-1024},
}