Edmondo Trentin, Ernesto Di Iorio. Unbiased SVM Density Estimation with Application to Graphical Pattern Recognition. In Joaquim Marques de Sá, Luís A. Alexandre, Wlodzislaw Duch, Danilo P. Mandic, editors, Artificial Neural Networks - ICANN 2007, 17th International Conference, Porto, Portugal, September 9-13, 2007, Proceedings, Part II. Volume 4669 of Lecture Notes in Computer Science, pages 271-280, Springer, 2007. [doi]
Abstract is missing.