Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters

Riccardo Trinchero, Mourad Larbi, Hakki M. Torun, Flavio G. Canavero, Madhavan Swaminathan. Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters. IEEE Access, 7:4056-4066, 2019. [doi]

Abstract

Abstract is missing.