Code Nano-Pattern Detection using Deep Learning

Anubhav Trivedi, Jitendra Singh Thakur, Atul Gupta. Code Nano-Pattern Detection using Deep Learning. In Sanjeev Jain, Atul Gupta, David Lo 0001, Diptikalyan Saha, Richa Sharma, editors, ISEC 2020: 13th Innovations in Software Engineering Conference, Jabalpur, India, February 27-29, 2020. ACM, 2020. [doi]

Authors

Anubhav Trivedi

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Jitendra Singh Thakur

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Atul Gupta

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