Anubhav Trivedi, Jitendra Singh Thakur, Atul Gupta. Code Nano-Pattern Detection using Deep Learning. In Sanjeev Jain, Atul Gupta, David Lo 0001, Diptikalyan Saha, Richa Sharma, editors, ISEC 2020: 13th Innovations in Software Engineering Conference, Jabalpur, India, February 27-29, 2020. ACM, 2020. [doi]
@inproceedings{TrivediTG20,
title = {Code Nano-Pattern Detection using Deep Learning},
author = {Anubhav Trivedi and Jitendra Singh Thakur and Atul Gupta},
year = {2020},
doi = {10.1145/3385032.3385050},
url = {https://doi.org/10.1145/3385032.3385050},
researchr = {https://researchr.org/publication/TrivediTG20},
cites = {0},
citedby = {0},
booktitle = {ISEC 2020: 13th Innovations in Software Engineering Conference, Jabalpur, India, February 27-29, 2020},
editor = {Sanjeev Jain and Atul Gupta and David Lo 0001 and Diptikalyan Saha and Richa Sharma},
publisher = {ACM},
isbn = {978-1-4503-7594-8},
}