Nicola Trivellin, Matteo Meneghini, C. De Santi, S. Vaccari, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, S. Takigawa, Tsuyoshi Tanaka, Daisuke Ueda. Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. Microelectronics Reliability, 51(9-11):1747-1751, 2011. [doi]
Abstract is missing.