Dan Trock, Rick Fisette. Recursive hierarchical DFT methodology with multi-level clock control and scan pattern retargeting. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 1128-1131, IEEE, 2016. [doi]
@inproceedings{TrockF16, title = {Recursive hierarchical DFT methodology with multi-level clock control and scan pattern retargeting}, author = {Dan Trock and Rick Fisette}, year = {2016}, url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459478}, researchr = {https://researchr.org/publication/TrockF16}, cites = {0}, citedby = {0}, pages = {1128-1131}, booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016}, editor = {Luca Fanucci and Jürgen Teich}, publisher = {IEEE}, isbn = {978-3-9815-3707-9}, }