Recursive hierarchical DFT methodology with multi-level clock control and scan pattern retargeting

Dan Trock, Rick Fisette. Recursive hierarchical DFT methodology with multi-level clock control and scan pattern retargeting. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 1128-1131, IEEE, 2016. [doi]

@inproceedings{TrockF16,
  title = {Recursive hierarchical DFT methodology with multi-level clock control and scan pattern retargeting},
  author = {Dan Trock and Rick Fisette},
  year = {2016},
  url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459478},
  researchr = {https://researchr.org/publication/TrockF16},
  cites = {0},
  citedby = {0},
  pages = {1128-1131},
  booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
  editor = {Luca Fanucci and Jürgen Teich},
  publisher = {IEEE},
  isbn = {978-3-9815-3707-9},
}