Thomas Trouchkine, Guillaume Bouffard, Jessy Clédière. EM Fault Model Characterization on SoCs: From Different Architectures to the Same Fault Model. In 18th Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2021, Milan, Italy, September 17, 2021. pages 31-38, IEEE, 2021. [doi]
Abstract is missing.