Claudio Truzzi, Eric Beyne, Edwin Ringoot. Design of Test Modules for the Analysis of MCM Interconnects. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 614, IEEE Computer Society, 1996. [doi]
@inproceedings{TruzziBR96, title = {Design of Test Modules for the Analysis of MCM Interconnects}, author = {Claudio Truzzi and Eric Beyne and Edwin Ringoot}, year = {1996}, doi = {10.1109/EDTC.1996.494378}, url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494378}, researchr = {https://researchr.org/publication/TruzziBR96}, cites = {0}, citedby = {0}, pages = {614}, booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996}, publisher = {IEEE Computer Society}, isbn = {0-8186-7423-7}, }