Design rule check on the clock gating logic for testability and beyond

Kun-Han Tsai, Shuo Sheng. Design rule check on the clock gating logic for testability and beyond. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-8, IEEE Computer Society, 2013. [doi]

Authors

Kun-Han Tsai

This author has not been identified. Look up 'Kun-Han Tsai' in Google

Shuo Sheng

This author has not been identified. Look up 'Shuo Sheng' in Google