Du-Ming Tsai, Yan-Hsin Tseng, Wei-Yao Chiu. Surface defect detection in low-contrast images using basis image representation. In 14th IAPR International Conference on Machine Vision Applications, MVA 2015, Miraikan, Tokyo, Japan, 18-22 May, 2015. pages 186-189, IEEE, 2015. [doi]
Abstract is missing.