Cheongyuen W. Tsang, Yun Chiu, Johan P. Vanderhaegen, Sebastian Hoyos, Charles Chen, Robert W. Brodersen, Borivoje Nikolic. Background ADC calibration in digital domain. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 301-304, IEEE, 2008. [doi]
No references recorded for this publication.
No citations of this publication recorded.