James Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De. A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 282-283, IEEE, 2010. [doi]
@inproceedings{TschanzBLAKRGTWKD10,
title = {A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance},
author = {James Tschanz and Keith A. Bowman and Shih-Lien Lu and Paolo A. Aseron and Muhammad M. Khellah and Arijit Raychowdhury and Bibiche M. Geuskens and Carlos Tokunaga and Chris Wilkerson and Tanay Karnik and Vivek De},
year = {2010},
doi = {10.1109/ISSCC.2010.5433922},
url = {http://dx.doi.org/10.1109/ISSCC.2010.5433922},
researchr = {https://researchr.org/publication/TschanzBLAKRGTWKD10},
cites = {0},
citedby = {0},
pages = {282-283},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010},
publisher = {IEEE},
isbn = {978-1-4244-6033-5},
}