James Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De. A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 282-283, IEEE, 2010. [doi]
Abstract is missing.