Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen. Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process. In 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 23-25, 2016. pages 353-358, IEEE, 2016. [doi]
Abstract is missing.