Noise Analysis for 0.13um and Beyond

Ken Tseng. Noise Analysis for 0.13um and Beyond. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 12, IEEE Computer Society, 2003. [doi]

@inproceedings{Tseng03:1,
  title = {Noise Analysis for 0.13um and Beyond},
  author = {Ken Tseng},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/isqed/2003/1881/00/18810012.pdf},
  tags = {analysis},
  researchr = {https://researchr.org/publication/Tseng03%3A1},
  cites = {0},
  citedby = {0},
  pages = {12},
  booktitle = {4th  International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1881-8},
}