Wang-Dauh Tseng, Lung-Jen Lee. Reduction of Power Dissipation during Scan Testing by Test Vector Ordering. In Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra, editors, Eighth International Workshop on Microprocessor Test and Verification (MTV 2007), Common Challenges and Solutions, 5-6 December 2007, Austin, Texas, USA. pages 15-21, IEEE Computer Society, 2007. [doi]
Abstract is missing.