Tsu-Wei Tseng, Jin-Fu Li. A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-9, IEEE, 2008. [doi]
@inproceedings{TsengL08-0, title = {A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs}, author = {Tsu-Wei Tseng and Jin-Fu Li}, year = {2008}, doi = {10.1109/TEST.2008.4700617}, url = {http://dx.doi.org/10.1109/TEST.2008.4700617}, researchr = {https://researchr.org/publication/TsengL08-0}, cites = {0}, citedby = {0}, pages = {1-9}, booktitle = {2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008}, editor = {Douglas Young and Nur A. Touba}, publisher = {IEEE}, isbn = {978-1-4244-2403-0}, }