An Automated System for Checking Lithography Friendliness of Standard Cells

I-Lun Tseng, Yongfu Li, Valerio Perez, Vikas Tripathi, Zhao Chuan Lee, Yoong Seang Jonathan Ong. An Automated System for Checking Lithography Friendliness of Standard Cells. In 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Chengdu, China, October 26-30, 2018. pages 261-265, IEEE, 2018. [doi]

Abstract

Abstract is missing.