Tien-Hung Tseng, Shou-Chun Li, Kai-Chiang Wu. Lifetime Reliability Trojan Based on Exploring Malicious Aging. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 74-79, IEEE, 2018. [doi]
@inproceedings{TsengLW18,
title = {Lifetime Reliability Trojan Based on Exploring Malicious Aging},
author = {Tien-Hung Tseng and Shou-Chun Li and Kai-Chiang Wu},
year = {2018},
doi = {10.1109/ATS.2018.00025},
url = {https://doi.org/10.1109/ATS.2018.00025},
researchr = {https://researchr.org/publication/TsengLW18},
cites = {0},
citedby = {0},
pages = {74-79},
booktitle = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
publisher = {IEEE},
isbn = {978-1-5386-9466-4},
}