Shinzo Tsuboi, Genshiro Kawachi, Masahiro Mitani, Takashi Okada. Effects of Source and Drain Impurity Profile on Breakdown Voltage of High-Performance Si TFTs. Inf. Media Technol., 3(1):1-6, 2008. [doi]
@article{TsuboiKMO08,
title = {Effects of Source and Drain Impurity Profile on Breakdown Voltage of High-Performance Si TFTs},
author = {Shinzo Tsuboi and Genshiro Kawachi and Masahiro Mitani and Takashi Okada},
year = {2008},
doi = {10.11185/imt.3.1},
url = {https://doi.org/10.11185/imt.3.1},
researchr = {https://researchr.org/publication/TsuboiKMO08},
cites = {0},
citedby = {0},
journal = {Inf. Media Technol.},
volume = {3},
number = {1},
pages = {1-6},
}