Shigeo Tsuchida. Test and Repair of Nonvolatile Commodity and Embedded Memories. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1223-1224, IEEE Computer Society, 2002. [doi]
@inproceedings{Tsuchida02,
title = {Test and Repair of Nonvolatile Commodity and Embedded Memories},
author = {Shigeo Tsuchida},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431223.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/Tsuchida02},
cites = {0},
citedby = {0},
pages = {1223-1224},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}