Shuji Tsukiyama, Masahiro Fukui, Takashi Kambe. A new delay distribution model to take long-term degradation into account. In 4th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2013, Cusco, Peru, February 27 - March 1, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{TsukiyamaFK13,
title = {A new delay distribution model to take long-term degradation into account},
author = {Shuji Tsukiyama and Masahiro Fukui and Takashi Kambe},
year = {2013},
doi = {10.1109/LASCAS.2013.6519047},
url = {https://doi.org/10.1109/LASCAS.2013.6519047},
researchr = {https://researchr.org/publication/TsukiyamaFK13},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {4th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2013, Cusco, Peru, February 27 - March 1, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4897-3},
}