An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results

ChenKun Tsung, Hsiang-Yi Hsieh, Chao-Tung Yang. An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results. IEEE Access, 7:26497-26506, 2019. [doi]

Authors

ChenKun Tsung

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Hsiang-Yi Hsieh

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Chao-Tung Yang

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