ChenKun Tsung, Hsiang-Yi Hsieh, Chao-Tung Yang. An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results. IEEE Access, 7:26497-26506, 2019. [doi]
@article{TsungHY19,
title = {An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results},
author = {ChenKun Tsung and Hsiang-Yi Hsieh and Chao-Tung Yang},
year = {2019},
doi = {10.1109/ACCESS.2019.2901115},
url = {https://doi.org/10.1109/ACCESS.2019.2901115},
researchr = {https://researchr.org/publication/TsungHY19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {26497-26506},
}