Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa. Empirical Study on Specification Metrics to Predict Volatility and Software Defects. In TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018. pages 2479-2484, IEEE, 2018. [doi]
@inproceedings{TsunodaWFIHK18-0,
title = {Empirical Study on Specification Metrics to Predict Volatility and Software Defects},
author = {Taketo Tsunoda and Hironori Washizaki and Yoshiaki Fukazawa and Sakae Inoue and Yoshiiku Hanai and Masanobu Kanazawa},
year = {2018},
doi = {10.1109/TENCON.2018.8650274},
url = {https://doi.org/10.1109/TENCON.2018.8650274},
researchr = {https://researchr.org/publication/TsunodaWFIHK18-0},
cites = {0},
citedby = {0},
pages = {2479-2484},
booktitle = {TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5457-6},
}