Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa. Empirical Study on Specification Metrics to Predict Volatility and Software Defects. In TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018. pages 2479-2484, IEEE, 2018. [doi]
Abstract is missing.