Ryouhei Tsurumaki, Naohiro Noda, Kazushige Horio. Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers. Microelectronics Reliability, 73:36-41, 2017. [doi]
@article{TsurumakiNH17,
title = {Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers},
author = {Ryouhei Tsurumaki and Naohiro Noda and Kazushige Horio},
year = {2017},
doi = {10.1016/j.microrel.2017.04.019},
url = {https://doi.org/10.1016/j.microrel.2017.04.019},
researchr = {https://researchr.org/publication/TsurumakiNH17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {73},
pages = {36-41},
}