Jean-Michel Tualle, Kinia Barjean, Eric Tinet, Dominique Ettori. High sensitivity analysis of speckle patterns: a technological challenge for biomedical optics. In Ralf Widenhorn, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, Burlingame, California, USA, February 3-7, 2013. Volume 8659 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.