The challenge of shot-noise limited speckle patterns statistical analysis

Jean-Michel Tualle, Kinia Barjean, Eric Tinet, Dominique Ettori. The challenge of shot-noise limited speckle patterns statistical analysis. In Arnaud Darmont, Ralf Widenhorn, editors, Image Sensors and Imaging Systems 2017, IMSE 2017, Burlingame, CA, USA, January 29 - February 2, 2017. pages 33-38, Society for Imaging Science and Technology, 2017. [doi]

Abstract

Abstract is missing.