Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach - researchr publication authors

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Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara. Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 259, IEEE Computer Society, 2010. [doi]

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