Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara. Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 259, IEEE Computer Society, 2010. [doi]
@inproceedings{TuduLSF10,
title = {Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach},
author = {Jaynarayan T. Tudu and Erik Larsson and Virendra Singh and Hideo Fujiwara},
year = {2010},
doi = {10.1109/ETSYM.2010.5512732},
url = {http://dx.doi.org/10.1109/ETSYM.2010.5512732},
tags = {testing, graph-rewriting, rewriting, systematic-approach},
researchr = {https://researchr.org/publication/TuduLSF10},
cites = {0},
citedby = {0},
pages = {259},
booktitle = {15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-5833-2},
}