Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke. Silicon evaluation of longest path avoidance testing for small delay defects. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.