Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation

V. I. Turchanikov, A. N. Nazarov, V. S. Lysenko, V. Ostahov, O. Winkler, B. Spangenberg, H. Kurz. Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation. Microelectronics Reliability, 47(4-5):626-630, 2007. [doi]

Abstract

Abstract is missing.