V. I. Turchanikov, A. N. Nazarov, V. S. Lysenko, V. Ostahov, O. Winkler, B. Spangenberg, H. Kurz. Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation. Microelectronics Reliability, 47(4-5):626-630, 2007. [doi]
Abstract is missing.