Effective Low Leakage 6T and 8T FinFET SRAMs: Using Cells With Reverse-Biased FinFETs, Near-Threshold Operation, and Power Gating

Michael A. Turi, José G. Delgado-Frias. Effective Low Leakage 6T and 8T FinFET SRAMs: Using Cells With Reverse-Biased FinFETs, Near-Threshold Operation, and Power Gating. IEEE Trans. Circuits Syst. II Express Briefs, 67-II(4):765-769, 2020. [doi]

@article{TuriD20,
  title = {Effective Low Leakage 6T and 8T FinFET SRAMs: Using Cells With Reverse-Biased FinFETs, Near-Threshold Operation, and Power Gating},
  author = {Michael A. Turi and José G. Delgado-Frias},
  year = {2020},
  doi = {10.1109/TCSII.2019.2922921},
  url = {https://doi.org/10.1109/TCSII.2019.2922921},
  researchr = {https://researchr.org/publication/TuriD20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Circuits Syst. II Express Briefs},
  volume = {67-II},
  number = {4},
  pages = {765-769},
}