Jon Turino. DFT: Profit or Loss -- A Position Paper. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 269, IEEE Computer Society, 1993.
@inproceedings{Turino93,
title = {DFT: Profit or Loss -- A Position Paper},
author = {Jon Turino},
year = {1993},
researchr = {https://researchr.org/publication/Turino93},
cites = {0},
citedby = {0},
pages = {269},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}