Coverage-Aware Test Database Reduction

Javier Tuya, Claudio de la Riva, María José Suárez Cabal, Raquel Blanco. Coverage-Aware Test Database Reduction. IEEE Trans. Software Eng., 42(10):941-959, 2016. [doi]

Authors

Javier Tuya

This author has not been identified. It may be one of the following persons: Look up 'Javier Tuya' in Google

Claudio de la Riva

This author has not been identified. Look up 'Claudio de la Riva' in Google

María José Suárez Cabal

This author has not been identified. Look up 'María José Suárez Cabal' in Google

Raquel Blanco

This author has not been identified. Look up 'Raquel Blanco' in Google