Sarah Tymochko, Julien Chaput, Timothy Doster, Emilie Purvine, Jackson Warley, Tegan Emerson. Con Connections: Detecting Fraud from Abstracts using Topological Data Analysis. In M. Arif Wani, Ishwar K. Sethi, Weisong Shi, Guangzhi Qu, Daniela Stan Raicu, Ruoming Jin, editors, 20th IEEE International Conference on Machine Learning and Applications, ICMLA 2021, Pasadena, CA, USA, December 13-16, 2021. pages 403-408, IEEE, 2021. [doi]
Abstract is missing.