A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques

Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang. A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst., 13(1), 2008. [doi]

Abstract

Abstract is missing.