Theodoros Tziolas, Theodosis Theodosiou, Konstantinos Papageorgiou, Aikaterini Rapti, Nikolaos Dimitriou, Dimitrios Tzovaras, Elpiniki Papageorgiou. Wafer Map Defect Pattern Recognition using Imbalanced Datasets. In 13th International Conference on Information, Intelligence, Systems & Applications, IISA 2022, Corfu, Greece, July 18-20, 2022. pages 1-8, IEEE, 2022. [doi]
Abstract is missing.