Raimund Ubar, Sergei Kostin, Jaan Raik. Multiple stuck-at-fault detection theorem. In Jaan Raik, Viera Stopjaková, Heinrich Theodor Vierhaus, Witold A. Pleskacz, Raimund Ubar, Helena Kruus, Maksim Jenihhin, editors, IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012. pages 236-241, IEEE, 2012. [doi]
@inproceedings{UbarKR12-0,
title = {Multiple stuck-at-fault detection theorem},
author = {Raimund Ubar and Sergei Kostin and Jaan Raik},
year = {2012},
doi = {10.1109/DDECS.2012.6219064},
url = {http://dx.doi.org/10.1109/DDECS.2012.6219064},
researchr = {https://researchr.org/publication/UbarKR12-0},
cites = {0},
citedby = {0},
pages = {236-241},
booktitle = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012},
editor = {Jaan Raik and Viera Stopjaková and Heinrich Theodor Vierhaus and Witold A. Pleskacz and Raimund Ubar and Helena Kruus and Maksim Jenihhin},
publisher = {IEEE},
isbn = {978-1-4673-1187-8},
}