Raimund Ubar, Anton Tsertov, Artjom Jasnetski, Marina Brik. Software-based self-test generation for microprocessors with high-level decision diagrams. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.