A Two-Stage Deep Learning-Based Approach for Automatic Reading of Analog Meters

Shohei Ueda, Kaito Suzuki, Jumpei Kanno, Qiangfu Zhao. A Two-Stage Deep Learning-Based Approach for Automatic Reading of Analog Meters. In Joint 11th International Conference on Soft Computing and Intelligent Systems and 21st International Symposium on Advanced Intelligent Systems, SCIS/ISIS 2020, Hachijo Island, Japan, December 5-8, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

Shohei Ueda

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Kaito Suzuki

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Jumpei Kanno

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Qiangfu Zhao

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