Shohei Ueda, Kaito Suzuki, Jumpei Kanno, Qiangfu Zhao. A Two-Stage Deep Learning-Based Approach for Automatic Reading of Analog Meters. In Joint 11th International Conference on Soft Computing and Intelligent Systems and 21st International Symposium on Advanced Intelligent Systems, SCIS/ISIS 2020, Hachijo Island, Japan, December 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.