Junki Ueda, Kazuya Tsukamoto, Hiroshi Yamamoto, Daiki Nobayashi, Takeshi Ikenaga, Myung J. Lee. A Reliability Audit Mechanism based on Multi-layered Blockchain for Spatio-Temporal Data Retention System. In 20th IEEE Consumer Communications & Networking Conference, CCNC 2023, Las Vegas, NV, USA, January 8-11, 2023. pages 939-940, IEEE, 2023. [doi]
Abstract is missing.