A high-sensitive digital photosensor using MOS interface-trap charge pumping

Akihiro Uehara, Keiichiro Kagawa, Takashi Tokuda, Jun Ohta, Masahiro Nunoshita. A high-sensitive digital photosensor using MOS interface-trap charge pumping. IEICE Electronic Express, 1(18):556-561, 2004. [doi]

@article{UeharaKTON04,
  title = {A high-sensitive digital photosensor using MOS interface-trap charge pumping},
  author = {Akihiro Uehara and Keiichiro Kagawa and Takashi Tokuda and Jun Ohta and Masahiro Nunoshita},
  year = {2004},
  url = {http://joi.jlc.jst.go.jp/JST.JSTAGE/elex/1.556},
  researchr = {https://researchr.org/publication/UeharaKTON04},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {1},
  number = {18},
  pages = {556-561},
}